Document #: 38-05445 Rev. *H Page 4 of 17
Maximum Ratings
Exceeding the maximum ratings may impair the useful life of the
device. User guidelines are not tested.
Storage Temperature ................................ –65°C to + 150°C
Ambient Temperature with
Power Applied .......................................... –55°C to + 125°C
Supply Voltage to Ground
Potential ................................–0.3V to 3.9V (V
CCmax
+ 0.3V)
DC Voltage Applied to Outputs
in High-Z State
[5, 6]
...............–0.3V to 3.9V (V
CCmax
+ 0.3V)
DC Input Voltage
[5, 6]
........... –0.3V to 3.9V (V
CC max
+ 0.3V)
Output Current into Outputs (LOW) ............................ 20 mA
Static Discharge Voltage .......................................... > 2001V
(MIL-STD-883, Method 3015)
Latch Up Current ...................................................> 200 mA
Operating Range
Device Range
Ambient
Temperature
V
CC
[7]
CY62157EV30LL Industrial/
Auto-A
–40°C to +85°C 2.2V to
3.6V
Auto-E –40°C to +125°C
Electrical Characteristics
Over the Operating Range
Parameter Description Test Conditions
45 ns (Ind’l/Auto-A) 55 ns (Auto-E)
Unit
Min Typ
[8]
Max Min Typ
[8]
Max
V
OH
Output HIGH
voltage
I
OH
= –0.1 mA 2.0 2.0 V
I
OH
= –1.0 mA, V
CC
> 2.70V 2.4 2.4 V
V
OL
Output LOW
voltage
I
OL
= 0.1 mA 0.4 0.4 V
I
OL
= 2.1mA, V
CC
> 2.70V 0.4 0.4 V
V
IH
Input HIGH
voltage
V
CC
= 2.2V to 2.7V 1.8 V
CC
+ 0.3 1.8 V
CC
+ 0.3 V
V
CC
= 2.7V to 3.6V 2.2 V
CC
+ 0.3 2.2 V
CC
+ 0.3 V
V
IL
Input LOW
voltage
V
CC
= 2.2V to 2.7V –0.3 0.6 –0.3 0.6 V
V
CC
= 2.7V to 3.6V –0.3 0.8 –0.3 0.8 V
I
IX
Input leakage
current
GND < V
I
< V
CC
–1 +1 –4 +4 A
I
OZ
Output leakage
current
GND < V
O
< V
CC
, Output Disabled –1 +1 –4 +4 A
I
CC
V
CC
operating
supply current
f = f
max
= 1/t
RC
V
CC
= V
CCmax
I
OUT
= 0 mA
CMOS levels
18 25 18 35
mA
f = 1 MHz 1.8 3 1.8 4
I
SB1
Automatic CE
power down
current — CMOS
inputs
CE
1
> V
CC
0.2V, CE
2
< 0.2V
V
IN
>
V
CC
– 0.2V, V
IN
< 0.2V)
f = f
max
(Address and Data Only),
f = 0 (OE
, BHE, BLE and WE),
V
CC
= 3.60V
28 230A
I
SB2
[9]
Automatic CE
power down
current — CMOS
inputs
CE
1
> V
CC
– 0.2V or CE
2
< 0.2V,
V
IN
> V
CC
– 0.2V or V
IN
< 0.2V,
f = 0, V
CC
= 3.60V
28 230A
Notes
5. V
IL(min)
= –2.0V for pulse durations less than 20 ns.
6. V
IH(max)
= V
CC
+ 0.75V for pulse durations less than 20 ns.
7. Full device AC operation assumes a 100 s ramp time from 0 to V
cc
(min) and 200 s wait time after V
CC
stabilization.
8. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V
CC
= V
CC(typ)
, T
A
= 25 °C.
9. Chip enables (CE
1
and CE
2
), byte enables (BHE and BLE) and BYTE (48 TSOP I only) need to be tied to CMOS levels to meet the I
SB2
/ I
CCDR
spec. Other inputs can
be left floating.
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