Cypress Semiconductor CY14B101K Dokumentacja Pobierz pdf (Strona 17)

CY14B101K

Document Number: 001-06401 Rev. *J Page 17 of 29

Data Retention and Endurance

Parameter Description Min Unit

DATA

Data Retention 20 Years

Nonvolatile STORE Operations 200 K

Capacitance

These parameters are guaranteed but not tested.

Parameter Description Test Conditions Max Unit

Input Capacitance T

= 25°C, f = 1 MHz, V

= 0 to 3.0 V 7 pF

OUT

Output Capacitance 7pF

Thermal Resistance

These parameters are guaranteed but not tested.

Parameter Description Test Conditions 48-SSOP Unit

Thermal Resistance (junction to

ambient)

Test conditions follow standard test methods

and procedures for measuring thermal

impedance, in accordance with EIA/JESD51.

34.85 °C/W

Thermal Resistance (junction to case) 16.35 °C/W

Figure 7. AC Test Loads

AC Test Conditions

3.0V

OUTPUT

5 pF

R1 577

789

3.0V

OUTPUT

30 pF

R1 577

789

For Tri-state Specs

Input Pulse Levels ..................................................0 V to 3 V

Input Rise and Fall Times (10% - 90%)........................ <

5 ns

Input and Output Timing Reference Levels ................... 1.5 V

Not Recommended for New Designs

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