Cypress Semiconductor Perform STK12C68 Instrukcja Użytkownika Pobierz pdf (Strona 9)

STK12C68

Document Number: 001-51027 Rev. *G Page 9 of 22

Data Retention and Endurance

Parameter Description Min Unit

DATA

Data retention 100 Years

Nonvolatile STORE operations 1,000 K

Capacitance

In the following table, the capacitance parameters are listed.

[6]

Parameter Description Test Conditions Max Unit

Input capacitance T

= 25 C, f = 1 MHz,

= 0 to 3.0 V

8pF

OUT

Output capacitance 7pF

Thermal Resistance

In the following table, the thermal resistance parameters are listed.

[6]

Parameter Description Test Conditions 28-SOIC

28-PDIP

(300 mil)

28-PDIP

(600 mil)

28-CDIP 28-LCC Unit



Thermal resistance

(junction to ambient)

Test conditions follow

standard test methods and

procedures for measuring

thermal impedance, per EIA /

JESD51.

46.55 45.16 55.84 46.1 95.31 C/W



Thermal resistance

(junction to case)

27.95 31.62 25.74 5.01 9.01 C/W

Figure 6. AC Test Loads

AC Test Conditions

5.0 V

Output

30 pF

R1 963 

512 

5.0 V

Output

5 pF

R1 963



512



For Tristate Specs

Input pulse levels....................................................0 V to 3 V

Input rise and fall times (10% to 90%).......................... <

5 ns

Input and output timing reference levels ...........................1.5

Note

6. These parameters are guaranteed by design and are not tested.

1 2 3 4 5 6 7 8 9 10 11 12 13 14 ... 21 22

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