Cypress Semiconductor CY7C1386F Instrukcja Użytkownika Pobierz pdf (Strona 10)

CY7C1386D, CY7C1386F

CY7C1387D, CY7C1387F

Document Number: 38-05545 Rev. *H Page 10 of 36

Interleaved Burst Address Table

(MODE = Floating or V

)

First

Address

A1: A0

Second

Address

A1: A0

Third

Address

A1: A0

Fourth

Address

A1: A0

00 01 10 11

01 00 11 10

10 11 00 01

11 10 01 00

Linear Burst Address Table (MODE = GND)

First

Address

A1: A0

Second

Address

A1: A0

Third

Address

A1: A0

Fourth

Address

A1: A0

00 01 10 11

01 10 11 00

10 11 00 01

11 00 01 10

ZZ Mode Electrical Characteristics

Parameter Description Test Conditions Min Max Unit

DDZZ

Sleep mode standby current ZZ > V

– 0.2 V – 80 mA

ZZS

Device operation to ZZ ZZ > V

– 0.2 V – 2t

CYC

ZZREC

ZZ recovery time ZZ < 0.2 V 2t

CYC

–ns

ZZI

ZZ Active to sleep current This parameter is sampled – 2t

CYC

RZZI

ZZ Inactive to exit sleep current This parameter is sampled 0 – ns

[+] Feedback

1 2 ... 5 6 7 8 9 10 11 12 13 14 15 ... 35 36

DCD Sync SRAM 1
CY7C1387F (1 M × 18) 5
CY7C1386F (512 K × 36) 5
Single Read Accesses 8
Burst Sequences 9
Sleep Mode 9
(MODE = Floating or V 10
CY7C1386D, CY7C1386F 11
CY7C1387D, CY7C1387F 11
Disabling the JTAG Feature 13
Test Access Port (TAP) 13
Performing a TAP Reset 13
TAP Registers 13
TAP Instruction Set 13
Ordering Code Definitions 29
Units of Measure 33
Products 36
PSoC Solutions 36

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